CRAN/E | KSD

KSD

Goodness-of-Fit Tests using Kernelized Stein Discrepancy

Installation

About

An adaptation of Kernelized Stein Discrepancy, this package provides a goodness-of-fit test of whether a given i.i.d. sample is drawn from a given distribution. It works for any distribution once its score function (the derivative of log-density) can be provided. This method is based on "A Kernelized Stein Discrepancy for Goodness-of-fit Tests and Model Evaluation" by Liu, Lee, and Jordan, available at .

Key Metrics

Version 1.0.1
Published 2021-01-11 1209 days ago
Needs compilation? no
License MIT
License File
CRAN checks KSD results

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Maintainer

Maintainer

Min Hyung Kang

Minhyung.Daniel.Kang@gmail.com

Authors

Min Hyung Kang

aut / cre

Qiang Liu

aut

Material

README
NEWS
Reference manual
Package source

macOS

r-release

arm64

r-oldrel

arm64

r-release

x86_64

r-oldrel

x86_64

Windows

r-devel

x86_64

r-release

x86_64

r-oldrel

x86_64

Old Sources

KSD archive

Imports

pryr
graphics
stats

Suggests

datasets
ggplot2
gridExtra
mclust
mvtnorm