CRAN/E | ATmet

ATmet

Advanced Tools for Metrology

Installation

About

A collection of functions for smart sampling and sensitivity analysis for metrology applications, including computationally expensive problems.

Key Metrics

Version 1.2.1
R ≥ 2.7.0
Published 2020-05-06 1234 days ago
Needs compilation? no
License GPL-3
CRAN checks ATmet results

Downloads

Last 24 hours 0
Last 7 days 5 +67%
Last 30 days 24 -27%
Last 90 days 70 -59%
Last 365 days 881 -84%

Maintainer

Maintainer

Alexandre Allard

alexandre.allard@lne.fr

Authors

Severine Demeyer
Alexandre Allard
Bertr
Iooss

Material

Reference manual
Package source

In Views

ChemPhys

macOS

r-release

arm64

r-oldrel

arm64

r-release

x86_64

r-oldrel

x86_64

Windows

r-devel

x86_64

r-release

x86_64

r-oldrel

x86_64

Old Sources

ATmet archive

Depends

R ≥ 2.7.0
DiceDesign
lhs
metRology
msm
sensitivity