CRAN/E | ATmet

ATmet

Advanced Tools for Metrology

Installation

About

A collection of functions for smart sampling and sensitivity analysis for metrology applications, including computationally expensive problems.

Key Metrics

Version 1.2.1
R ≥ 2.7.0
Published 2020-05-06 1454 days ago
Needs compilation? no
License GPL-3
CRAN checks ATmet results

Downloads

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Maintainer

Maintainer

Alexandre Allard

alexandre.allard@lne.fr

Authors

Severine Demeyer
Alexandre Allard
Bertr
Iooss

Material

Reference manual
Package source

In Views

ChemPhys

macOS

r-release

arm64

r-oldrel

arm64

r-release

x86_64

r-oldrel

x86_64

Windows

r-devel

x86_64

r-release

x86_64

r-oldrel

x86_64

Old Sources

ATmet archive

Depends

R ≥ 2.7.0
DiceDesign
lhs
metRology
msm
sensitivity